Papers Published by Optical Perspectives Group

INTRODUCTION On-machine metrology is particularly important for diamond turning and grinding as it is difficult to remount and align a part if it does not meet off-line inspection criteria. There is also the issue of tool wear; a process that started well may fail part way through the cut, and if tool replacement is needed, […]

ABSTRACT  An autostigmatic microscope is described and its uses explained. Then an adaptation of the original instrument is described that uses current technological advances in laser diodes and video displays to turn an old workhorse into a versatile optical test and alignment device. This paper illustrates applications that make use of the capabilities of the […]

ABSTRACT We give an example of a Point Source Microscope (PSM) and describe its uses as an aid in the alignment of optical systems including the referencing of optical to mechanical datums. The PSM is a small package (about 100x150x30 mm), including a point source of light, beam splitter, microscope objective and digital CCD camera […]

1. Introduction As optical systems become more complex and packaging requirements more severe and multi-dimensional, proper alignment becomes more challenging. Yet with current improvements in the manufacture and measurement of optical surfaces to nm levels, alignment is one of the few remaining opto-mechanical aspects of optical system manufacture and assembly where improvement in optical performance […]

ABSTRACT Although the PSM is primarily an alignment instrument, it can also be used to determine the conjugates of parabolic and elliptical off-axis mirrors. By positioning the PSM at the sagittal and tangential foci of the mirrors, the conjugate distances of the mirror can be found using a laser range finder, for example. Knowing the […]

1. Introduction:  Laser trackers are an accurate and efficient tool for finding the locations of features in a threedimensional space but they rely on Spherically Mounted Retroreflectors (SMR) to return the laser beam to the tracker. If the feature cannot be contacted or it is not convenient to use an SMR another method must be […]