Published Papers
Webinar: The Autostigmatic Microscope and Its Uses
This webinar with Robert Parks is presented by the OSA Systems and Instrumentation Technical Group. Topics discussed include the evolution of the classical autostigmatic microscope (ASM) into an all-purpose optical alignment tool whose use has been described in over 60 optical engineering papers that illustrate real-world systems applications. The evolution that led to the current […]
MFT Microfinish Topographer Mentioned in Five Papers Given at Telescope Conference
MFT was mentioned in five of the papers given at the SPIE Conference on Telescopes in Edinburgh, Scotland at the end of June 2016 by authors from six different international research organizations. PROC. SPIE 99055O, SEE MENTION OF MFT ON P. 19, FIG 18. The surface roughness measurements of a silicon plate with a multilayer […]
Why Is Optical Alignment So Important to Optical System Performance?
The main reason is that the other two major factors in performance, optical design and optical fabrication, have already been improved to the very limits of what can be accomplished. After spending good money on a near perfect design and fabrication of optical components does it make any sense not to assemble them in perfect […]
A Contemporary Version of the Autostigmatic Microscope and Its Uses
OUTLINE DESCRIPTION OF AN ASM First description in English literature is Drysdale, Trans. Opt. Soc. London, 1900 Fig. 2 from the Drysdale paper of 1900 Further from the Drysdale paper CAT’S EYE AND CONFOCAL FOCI CAT’S EYE Cat’s eye reflection CONFOCAL FOCI Confocal reflection EXAMPLES OF CAT’S EYE AND COFC SPOT IMAGES OUT OF FOCUS […]
Reverse Engineering Lens Elements
Introduction Need for reverse engineering Properties needed to reverse engineer Measurements needed Measurements that can be made Center thickness Rear Radius Back focal length No closed form solution for unknowns Spreadsheet example N, t and r2 were estimated and a, b and c calculated Solver used to minimize lower right hand cell to give calculated n, t […]
Non-Contact Probe For On-Machine Metrology
INTRODUCTION On-machine metrology is particularly important for diamond turning and grinding as it is difficult to remount and align a part if it does not meet off-line inspection criteria. There is also the issue of tool wear; a process that started well may fail part way through the cut, and if tool replacement is needed, […]